52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Mr. Lay Lay Goh
Staff Engineer
Altera Corporation
San Jose, CA
USA 95134
Papers:
Automated Workflow for High-Precision Delayering and Failure Analysis in 7nm Programmable Logic
Closing Test Coverage Gaps in High-Volume Semiconductor Manufacturing: A Debug Methodology Leveraging Failure Analysis