52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Ms. Bi Jen Chen
DIRECTOR
Micron
OMT YE
Taoyuan, Taoyuan
Taiwan
Papers:
Low-Temperature CVD Oxide Deposition for Photoresist Protection
Multiscale Characterization of Hydrogen Plasma–Induced Defects in Semiconductor Materials