52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Mr. Aik Leng Tan
Staff Engineer
Sandisk
Simpang Ampat, Penang
Malaysia 14110
Papers:
A Direct Backside Approach Failure Analysis in High-Layer-Count 3D Flash Memory for High Resistance Failures