52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Dr. Felix Beaudoin, FASM
GLOBALFOUNDRIES Inc.
Malta, NY
USA 12020
Papers:
Failure Analysis Techniques and Lab Requirements for Silicon Photonics Fault Isolation
Integrated Circuit Fault Isolation Readiness For Silicon Photonics