52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Al Feng
Manager
Thermo Fisher Scientific
Fremont, CA
USA
Papers:
E-beam Probing for Hardware Security Assessment of Data Leakage in Microcontrollers: A Flash Memory Case Study