Dr. Christopher H. Kang

Thermofisher
Focused Ion Beam Lab
Hopewell Junction, NY
USA 12533

Papers:

A Novel Accurate Thickness Measurement Method Using Specific Structure within a DRAM Sample and Tilt Adjustment
Enhancing Cross-Sectional Milling Performance in Plasma Focused Ion Beam Using Shadow Masking
Automated Navigation Framwork for High-Density 3D VNAND using Structural Periodicity-Based Address Mapping and Computer Vision
Deep Learning-Based 2D ROI Alignment for Automated Semiconductor SEM Imaging