52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Dr. Niemat Moultif
University of Rouen
Normandy
France
Papers:
On the Impact of Proton Irradiation on TDDB Reliability of SiC MOSFETs