Technology Specific and Featured Topics I

Sunday, October 4, 2026: 8:00 AM-10:00 AM
Jason Holm, PhD, National Institute of Standards and Technology and William Hubbard, PhD, NanoElectronic Imaging, Inc.
8:00 AM
Fundamental Considerations in the Justification, Design & Construction of an Analytical Laboratory for High Tech Imaging & Processing Tools
Mr. Steven Herschbein, IBM / GFS Retired; Ms. Cheryl Hartfield, MA, FASM, Waviks, Inc.; Mr. Michael Wong, ThermoFisher Scientific
8:20 AM
Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Mr. Michael Koegel, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Mr. Frank Altmann, Fraunhofer Institute for Microstructure of Materials and Systems; Dr. Sebastian Brand, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
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