52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Student Poster Contest
Wednesday, October 7, 2026: 3:00 PM-4:00 PM
3:00 PM
Activation of Silicon Implanted into Gallium Nitride Using Ultraviolet Laser and RTA Thermal Treatment
Mr. Chia H. Chang
,
Taiwan Semiconductor Research Institute (TSRI)
3:20 PM
Low-Resistance Si-Implanted GaN via Capping-Free UV-Laser/Multi-RTA
Mr. Chia H. Chang
,
Taiwan Semiconductor Research Institute (TSRI)
3:40 PM
Non‑Destructive Metrology of PCBs and Advanced Packages Using 3D X‑ray Microscopy
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