Wednesday, October 7, 2026: 3:00 PM-4:00 PM
3:20 PM
A Dual-Pathway Neural Network for X-Ray Die Anomaly Detection
Mr. Kuan-Jui Tu, Ardentec Corporation;
Mr. Ting-Hsueh Chuang, Lunghua University of Science and Technology;
Dr. Wen-Fei Hsieh, Ardentec Corporation;
Prof. Ta-Lun Sung, Lunghua University of Science and Technology;
Mr. Vincent Chen, Ardentec Corporation;
Mrs. Irene Ou, Ardentec Corporation;
Dr. Yung Song Lou, Ardentec Corporation
9:00 PM
TESCAN FemtoChisel: High-Throughput Laser Sample Preparation and Device De-processing with LPL and Intelligent Multigas Processing, Reserving FIB for Final High-Resolution Steps
Mohammad Taghi Mohammadi Anaei, UConn;
Dr. Nicholas May, Tescan, University of Connecticut, REFINE Lab;
Matthew Maniscalco, UConn;
Dr. Hongbin Choi, Tescan and UConn;
José Rodrigo Tavousi, Tescan;
Wesley Roser, UConn;
Herve Mace, Tescan;
Peyman Ahmadi, Tescan;
Dr. Sina Shahbazmohamadi, Tescan;
Dr. Pouya Tavousi, Tescan
12:40 AM
Thermal Management and Degradation Mechanisms in Heterogeneously Integrated Silicon Photonic Light Sources
Mr. Chin Wei Sher, Hon Hai Research Institute, Foxconn;
Mr. Yu Lin Huang, Hon Hai Research Institute, Foxconn;
Yu Lin Teng, Hon Hai Research Institute, Foxconn;
Jen-Shuo Liao, Hon Hai Research Institute, Foxconn;
Mr. Ta Yung Liu, Hon Hai Research Institute, Foxconn;
Hao Chung Kuo, Hon Hai Research Institute, Foxconn;
Ms. Chiu Pei Ju, Materials Analysis Technology Inc.;
Mr. Yu Feng Ko, Materials Analysis Technology Inc.
