Microscopy III

Sunday, October 4, 2026: 1:30 PM-3:30 PM
1:30 PM
TEM Specimen Preparation: Enabling Advanced Device Characterization and Failure Analysis
Dr. Cecile S. Bonifacio, EA Fischione Instruments
1:50 PM
Advanced FIB/SEM Sample Preparation and Analysis Techniques
Dr. Sam Subramanian, NXP Semiconductors
See more of: Tutorial
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