Microscopy IV

Sunday, October 4, 2026: 3:50 PM-5:50 PM
206B (Henry B. González Convention Center)
3:50 PM
EBSD and High-Resolution EBSD for Semiconductor Failure Analysis: Practical Methods and Applications
Dr. Pawel Nowakowski, E.A. Fischione Instruments, Inc.
4:10 PM
Application of Kelvin Probe Force Microscopy Techniques for Semiconductor Device Failure Analysis
Dr. Yoichi Miyahara, Texas State University
See more of: Tutorial
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