52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Microscopy V
Sunday, October 4, 2026: 3:50 PM-5:50 PM
3:50 PM
Atom probe tomography for semiconductor applications: a tutorial
Dr. Katherine P. Rice
,
Cameca, Inc.
4:10 PM
Charged Particle Systems: Fundamentals, Trends & Opportunities
Dr. E.L. Principe
,
Synchrotron Research Inc.
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