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| Yield | ||||
| Location: Meeting Room C/D (Worcester's Centrum Centre) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editors: | Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD | |||
| Session Chairs: | Rose Ring SMSC Austin, Austin, TX Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| 12:15 PM | Lunch | |||
| 1:15 PM | Yield Basics for Failure Analysis | |||
| 2:30 PM | Applications of CAD Navigation Systems | |||
| 3:30 PM | Break | |||
| 3:45 PM | The Challenges and Advantages of Logic Mapping | |||
| 4:30 PM | Defect-Oriented Testing | |||