|
Back to "Tutorial" Search | Back to Main Search | |||
Yield | ||||
Location: Meeting Room C/D (Worcester's Centrum Centre) | ||||
(Please check final room assignments on-site). | ||||
Session Description: | ||||
Editors: | Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD | |||
Session Chairs: | Rose Ring SMSC Austin, Austin, TX Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
12:15 PM | Lunch | |||
1:15 PM | Yield Basics for Failure Analysis | |||
2:30 PM | Applications of CAD Navigation Systems | |||
3:30 PM | Break | |||
3:45 PM | The Challenges and Advantages of Logic Mapping | |||
4:30 PM | Defect-Oriented Testing |