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| Microscopy Tools 2 | ||||
| Location: Meeting Room J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editor: | Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM | |||
| Session Chairs: | Dr. Sam Subramanian Freescale Semiconductor, Inc., Austin, TX Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| 1:00 PM | GEN055.1 | SEM Basics | ||
| 2:15 PM | GEN055.2 | Focused Ion Beam for Fault Isolation and Circuit Editi/Design Debug Tool (New for 2005) | ||
| 3:45 PM | GEN055.3 | Focused Ion Beam - A Sample Preparation Tool (New for 2005) | ||
| 4:30 PM | Break | |||
| 4:45 PM | GEN055.4 | Transmission Electron Microscopy | ||
| 5:45 PM | GEN055.5 | Advanced Techniques in Sample Preparation and TEM Analysis of Microelectronic Materials | ||