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| Fault Isolation 1 | ||||
| Location: Meeting Room J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editor: | Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM | |||
| Session Chair: | Rose Ring SMSC Austin, Austin, TX | |||
| 8:00 AM | GEN0513.1 | Magnetic Based Current Imaging for Fault Isolation in Die and Packages | ||
| 9:00 AM | GEN0513.2 | Flip-Chip and Backside Analysis Techniques | ||
| 10:00 AM | Break | |||
| 10:15 AM | GEN0513.3 | Beam-Based Defect Localization Techniques | ||
| 12:00 PM | Intermission | |||