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| Session 10: Nanoprobing | ||||
| Location: Meeting Room J1-J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chairs: | Dr. Shawn Decker South Dakota School of Mines, Rapid City, SD Mr. Phil Kaszuba IBM Microelectronics, Essex Junction, VT Dr. William E. Vanderlinde Laboratory for Physical Sciences, College Park, MD | |||
| 4:00 PM | Investigations on the Influence of Focused Electron Beam on Electrical Characteristics of Integrated Devices | |||
| 4:25 PM | Combine Nano-Probing Technique with Mathematics to Model and Identify Invisible Failure | |||
| 4:50 PM | Failure Analysis of DC Failure in Advanced Memory Devices using Nanoprobing and Scanning Capacitance Microscope | |||
| 5:15 PM | Measuring Static Noise Margin of 65nm node SRAMs using a 7-point SEM Nanoprobing Technique | |||