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Session 7: Package and Assembly Level FA 1
Location: Meeting Room J3 (San Jose McEnery Convention Center)
(Please check final room assignments on-site).
Session Description:

Session Chairs:Dr. Deepak Goyal Intel Corporation, Chandler, AZ
Ms Zezhong Fu Intel Corporation, Chandler, AZ
10:20 AMAl Pad Corrosion Mechanism Study when Dicing Saw
10:45 AMEffect of Inter-die Adhesive Profile on the Integrity of Die Surface in Die Stacking Package
11:10 AMEffect of Die Chip-outs and Reflow Temperature on the Mechanical Behavior of a 5-Die-Stacked Chip Scale Package
11:35 AMStudy of FBGA Burn Failure under THB Test