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| FIB | ||||
| Location: J1/J4 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chair: | Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| 10:30 AM | FIB – A Design Repair / Fault Isolation Tool | |||
| 12:00 PM | Lunch | |||
| 1:00 PM | Focused Ion Beam — a Sample Preparation Tool | |||
| 1:45 PM | Failure Localization with Active and Passive Voltage Contrast in FIB and SEM | |||