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The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM |
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| Session 8: Photon Beam Based Techniques - 2 | ||||
| Location: Meeting Room J1-J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chairs: | Dr. Stephen Bradley Ippolito IBM, Hopewell Junction, NY Dr. Aaron Falk OptoMetrix, Inc, Renton, WA | |||
| 8:00 AM | Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation | |||
| 8:25 AM | OBIC Measurements without Lasers or Raster-Scanning Based On Compressive Sensing | |||
| 8:50 AM | Development of Laser-Based Variation Mapping Techniques – Another Way to Increase the Successful Analysis Rate On Analog & Mixed-Mode ICs | |||
| 9:15 AM | UV Emission Microscopy Development for High Band Gap Components | |||