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10.3
Case Study: Combined Dynamic Laser Stimulation and Static Emission Microscopy Techniques Applied to Scan Test Failure On Mixed Mode Device
Tuesday, November 13, 2012: 1:55 PM
101AB (Phoenix Convention Center)
Ms. Magdalena Anna Sienkiewicz
,
Freescale Semiconductor, Toulouse, France
Philippe Rousseille
,
Freescale Semiconductor, Toulouse, France
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Session 10: Photon Based Techniques: More Applications
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