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10 Session 10: Photon Based Techniques: More Applications

Tuesday, November 13, 2012: 1:05 PM-2:45 PM
101AB (Phoenix Convention Center)
Session Chairs:
Dr. Felix Beaudoin and Mr. Jim Colvin
1:05 PM
10.1
Lockin Phase Mapping of Modulated Reflectance in Dynamically Operating Mixed IC Devices
Dr. Zhongling Qian, Infineon Technologies AG
1:30 PM
10.2
Advanced Laser Probe Techniques Applied to FA of RF Integrated Circuits - A Case Study
Mr. Mark E. Kimball, Maxim Integrated Products, Inc.; Christopher Nemirow, DCG Systems
1:55 PM
10.3
Case Study: Combined Dynamic Laser Stimulation and Static Emission Microscopy Techniques Applied to Scan Test Failure On Mixed Mode Device
Ms. Magdalena Anna Sienkiewicz, Freescale Semiconductor; Philippe Rousseille, Freescale Semiconductor
2:20 PM
10.4
From EBT to LVP, from 130nm to 28nm node, Internal Timing Characterization Evolution
Dr. Antoine Reverdy, SECTOR TECHNOLOGIES; Mr. Thierry Parrassin, ST Microelectronics; Mr. Philippe Larre, STMicroelectronics; Sylvain Dudit, ST Microelectronics; Michel Vallet, ST Microelectronics; Mr. Herve Deslandes, DCG Systems
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