Start | At-A-Glance | Browse by Day | Author Index

3.1 A New Technique for Non-Invasive Short Localization in Thin Dielectric Layers by Electron Beam Absorbed Current (EBAC) Imaging

Monday, November 12, 2012: 1:25 PM
102AB (Phoenix Convention Center)
Mr. Michél Simon-Najasek , Fraunhofer Institute for Mechanics of Materials, Halle, Germany
Jörg Jatzkowski , Fraunhofer Institute for Mechanics of Materials, Halle, Germany
Christian Große , Fraunhofer Institute for Mechanics of Materials, Halle, Germany
Mr. Frank Altmann , Fraunhofer Institute for Mechanics of Materials, Halle, Germany
Mr. Jens Beyersdorfer , Fraunhofer Institute for Mechanics of Materials, Halle, Germany
See more of: Session 3: Nanoprobing Techniques
See more of: Symposium