23.1 Fault Localization Improvement Through an Intra-Cell Diagnosis Approach

Thursday, November 15, 2012: 3:25 PM
101AB (Phoenix Convention Center)
Mr. Zhenzhou Sun , LIRMM/STMicroelectronics, Montpellier/Grenoble, France
Dr. Alberto Bosio , LIRMM, Montpellier, France
Mr. Etienne Auvray , ST Microelectronics,, Grenoble Cedex, France
Prof. Patrick Girard , LIRMM, Montpellier, France
Dr. Luigi Dilillo , LIRMM, Montpellier, France
Dr. Aida Todri , LIRMM, Montpellier, France
Dr. Arnaud Virazel , LIRMM, Montpellier, France
See more of: Session 23: Test and Diagnosis
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