Session 23: Test and Diagnosis

Eide, Geir

Thursday, November 15, 2012: 3:25 PM-5:05 PM

101AB (Phoenix Convention Center)

Session Chairs:

Mr. Geir Eide and Mr. Mark E. Kimball

3:25 PM

23.1

Fault Localization Improvement Through an Intra-Cell Diagnosis Approach
Mr. Zhenzhou Sun, LIRMM/STMicroelectronics; Dr. Alberto Bosio, LIRMM; Mr. Etienne Auvray, ST Microelectronics,; Prof. Patrick Girard, LIRMM; Dr. Luigi Dilillo, LIRMM; Dr. Aida Todri, LIRMM; Dr. Arnaud Virazel, LIRMM

3:50 PM

23.2

Logic Yield Learning Vehicle Failure Analysis In Technology Development
Dr. Zhigang Song, IBM; Dr. Felix Beaudoin, IBM; Stephen Lucarini, IBM; Stephen Wu, IBM; Yunyu Wang, IBM; Lior Arie, IBM; Kobi Steiner, IBM

4:15 PM

23.3

A Novel Scan-based Yield Enhancement Methodology for Faster Yield Ramp
Dr. Goh Szu Huat, GLOBALFOUNDRIES

4:40 PM

23.4

Delay Fault Model Evaluation Using Tester Response Data
Mr. Cheng Xue, Carnegie Mellon University; Prof. R.D. Blanton, Carnegie Mellon University

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