Start | At-A-Glance | Browse by Day | Author Index

2.3 High-frequency TSV Failure Detection Method with Z Parameter

Monday, November 12, 2012: 2:15 PM
101AB (Phoenix Convention Center)
Ms. Joohee Kim , KAIST, Daejeon, South Korea
Daniel Jung , KAIST, Daejeon, South Korea
Jonghyun Cho , KAIST, Daejeon, South Korea
Jun So Pak , KAIST, Daejeon, South Korea
Joungho Kim , KAIST, Daejeon, South Korea
Dr. Jong Min Yook , KETI, Seongnam-si, South Korea
Jun Chul Kim , KETI, Seongnam-si, South Korea
See more of: Session 2: Fault Isolation and Failure Analysis of TSV
See more of: Symposium