From EBT to LVP, from 130nm to 28nm node, Internal Timing Characterization Evolution

Tuesday, November 13, 2012: 2:20 PM

101AB (Phoenix Convention Center)

Dr. Antoine Reverdy , SECTOR TECHNOLOGIES, Gières, France

Mr. Thierry Parrassin , ST Microelectronics, Crolles, France

Mr. Philippe Larre , STMicroelectronics, Crolles, France

Sylvain Dudit , ST Microelectronics, Crolles, France

Michel Vallet , ST Microelectronics, Crolles, France

Mr. Herve Deslandes , DCG Systems, Fremont, CA

10.4 From EBT to LVP, from 130nm to 28nm node, Internal Timing Characterization Evolution