Enhanced Comparison of Lock-in Thermography and Magnetic Microscopy for 3D Defect Localization of System in Packages

Monday, November 12, 2012: 3:20 PM

101AB (Phoenix Convention Center)

Mr. Christian Schmidt , Fraunhofer Institute for Mechanics of Materials, Halle, Germany

Frank Altmann , Fraunhofer Institute for Mechanics of Materials, Halle, Germany

Mr. David Vallett , IBM Systems and Technology Group, Essex Jct., VT

4.1 Enhanced Comparison of Lock-in Thermography and Magnetic Microscopy for 3D Defect Localization of System in Packages