Failure Analysis of Electronic Material Using Cryogenic FIB-SEM

Wednesday, November 14, 2012: 5:10 PM

101AB (Phoenix Convention Center)

Mr. Nicholas Antoniou , Harvard University, Cambridge, MA

Cheryl Hartfield , Omniprobe, Inc., Dallas, TX

Adam C Graham , Harvard University, Cambridge, MA

Gonzalo Amador , Omniprobe, Inc., Dallas, TX

17.5 Failure Analysis of Electronic Material Using Cryogenic FIB-SEM