19 Session 19: Counterfeit Electronics Detection and Mitigation

Thursday, November 15, 2012: 10:15 AM-11:30 AM
101AB (Phoenix Convention Center)
Session Chairs:
Mr. Bhanu P. Sood and Mr. Gary Shade
10:15 AM
Decapsulation and Internal Visual Inspection
Mr. Erik Jordan, Nisene Technology Group
10:40 AM
11:05 AM
Counterfeit IC’s Overview – From a Test Lab’s Perspective
Mr. David Loaney, Premier Semiconductor Services LLC
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