Session 7: Rethinking the FA Process

Ring, Rose

Tuesday, November 13, 2012: 8:00 AM-9:40 AM

102AB (Phoenix Convention Center)

Session Chairs:

Ms. Rose Ring and Mr. David L. Burgess

8:00 AM

7.1

Words for the “Whys”
Mr. Richard J. Ross, N/A

8:25 AM

7.2

EOS (Electrical Overstress) – the Old, Unknown Phenomenon?
Prof. Peter Jacob, EMPA Duebendorf

8:50 AM

7.3

DRAM Cell Fault Localization Using Passive Voltage Contrast
Dr. San Lin Liew, Inotera Memories Inc.; Ms. Yu Pei Wei, Inotera Memories Inc.; Ms. Bi Jen Chen, Inotera Memories Inc.; Mr. Hua Sheng Chen, Inotera Memories Inc.; Dr. Jian Shing Luo, Inotera Memories Inc.

9:15 AM

7.4

3D Tomography Analysis of Dark Voltage Contrast Failure In PCRAM Device
Mr. Jangwon Oh, SK Hynix Semiconductor Inc; Jonghyeop Kim, SK Hynix Semiconductor Inc; Taegwon Lee, SK Hynix Semiconductor Inc; Seungjoon Jeon, SK Hynix Semiconductor Inc; Won Kim, SK Hynix Semiconductor Inc; Hojoung Kim, SK Hynix Semiconductor Inc; Changreol Kim, SK Hynix Semiconductor Inc

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