18 Session 18: Case Studies II

Wednesday, November 14, 2012: 3:30 PM-4:45 PM
102AB (Phoenix Convention Center)
Session Chairs:
Ms. Rose Ring and Mr. David L. Burgess
3:30 PM
Fault Isolation Techniques and Studies on Low Resistance Gross Short Failures
Mr. T.H. Ng, Globalfoundries Singapore Pte. Ltd.; Mr. P.K. Tan, Globalfoundries Singapore Pte. Ltd.; Z.H. Mai, Globalfoundries Singapore Pte. Ltd.; W.Y. Lee, Globalfoundries Singapore Pte. Ltd.; Y.Z. Ma, Globalfoundries Singapore Pte. Ltd.; R. He, Globalfoundries Singapore Pte. Ltd.; M.K. Dawood, Globalfoundries Singapore Pte. Ltd.; G.R. Low, Globalfoundries Singapore Pte. Ltd.; Hao Tan, Chartered Semiconductor Manufacturing Pte. Ltd.; Mr. C.K. Oh, Globalfoundries Singapore Pte. Ltd.; Jeffrey Lam, Globalfoundries Singapore Pte. Ltd.
3:55 PM
A Silicon Debugging Methodology on Customer Prototypes for Wafer Foundries
Dr. Z.H. Mai, Globalfoundries Singapore Pte Ltd.; T. H. Ng, Globalfoundries Singapore Pte Ltd.; M. K. Dawood, Globalfoundries Singapore Pte Ltd.; P. K. Tan, Globalfoundries Singapore Pte Ltd.; J. C. Lam, Globalfoundries Singapore Pte Ltd.
4:20 PM
Failure Analysis of Nickel Silicide Piping Defects: A Case Study
Mr. Clifford Howard, Freescale Semiconductor; Sam Subramanian, Freescale Semiconductor; Yuk Tsang, Freescale Semiconductor; Tony Chrastecky, Freescale Semiconductor; Khiem Ly, Freescale Semiconductor; Kent Erington, Freescale Semiconductor; Mr. Juan Ybarra, Freescale
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