Wednesday, November 14, 2012: 3:30 PM-4:45 PM
102AB (Phoenix Convention Center)
Session Chairs:
Ms. Rose Ring
and
Mr. David L. Burgess
3:30 PM
Fault Isolation Techniques and Studies on Low Resistance Gross Short Failures
Mr. T.H. Ng, Globalfoundries Singapore Pte. Ltd.;
Mr. P.K. Tan, Globalfoundries Singapore Pte. Ltd.;
Z.H. Mai, Globalfoundries Singapore Pte. Ltd.;
W.Y. Lee, Globalfoundries Singapore Pte. Ltd.;
Y.Z. Ma, Globalfoundries Singapore Pte. Ltd.;
R. He, Globalfoundries Singapore Pte. Ltd.;
M.K. Dawood, Globalfoundries Singapore Pte. Ltd.;
G.R. Low, Globalfoundries Singapore Pte. Ltd.;
Hao Tan, Chartered Semiconductor Manufacturing Pte. Ltd.;
Mr. C.K. Oh, Globalfoundries Singapore Pte. Ltd.;
Jeffrey Lam, Globalfoundries Singapore Pte. Ltd.
4:20 PM
Failure Analysis of Nickel Silicide Piping Defects: A Case Study
Mr. Clifford Howard, Freescale Semiconductor;
Sam Subramanian, Freescale Semiconductor;
Yuk Tsang, Freescale Semiconductor;
Tony Chrastecky, Freescale Semiconductor;
Khiem Ly, Freescale Semiconductor;
Kent Erington, Freescale Semiconductor;
Mr. Juan Ybarra, Freescale
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