Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation

Tuesday, November 5, 2013: 8:00 AM

Meeting Room 230A (San Jose McEnery Convention Center)

Mr. Steven B. Herschbein , IBM Systems & Technology, Hopewell Junction, NY

Dr. Chad Rue , FEI Company, Hillsboro, OR

Mr. John A. Giacobbe , Intel Corporation, Folsom, CA

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