39th International Symposium for Testing and Failure Analysis (November 3

Tutorial

Electrical and Yield
Session Chair: Dr. Felix Beaudoin and Dr. Jenny Ma

Package and Physical FA
Session Chair: Mr. Jake E. Klein and Mr. Chris Richardson

Microscopy
Session Chair: Mr. Carl M. Nail and Mr. Bryan Tracy

Fault Localization
Session Chair: Ms. Susan Li and Dr. Mayue Xie

Technology Specific FA
Session Chair: Mr. Jeremy A. Walraven and Mr. Mark Jenkins

Green Energy
Session Chair: Dr. Mayue Xie

FIB
Session Chair: Mr. Carl M. Nail and Mr. Bryan Tracy

Fault Localization
Session Chair: Ms. Susan Li and Dr. Mayue Xie

Fault Localization
Session Chair: Ms. Susan Li and Dr. Mayue Xie

Package and Physical FA
Session Chair: Mr. Jake E. Klein

Electrical and Yield
Session Chair: Dr. Felix Beaudoin and Dr. Jenny Ma

Fault Localization
Session Chair: Ms. Susan Li and Dr. Mayue Xie