FIB

Tuesday, November 5, 2013: 8:00 AM-9:00 AM

Meeting Room 230A (San Jose McEnery Convention Center)

Session Chairs:

Mr. Carl M. Nail and Mr. Bryan Tracy

8:00 AM

Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation
Mr. Steven B. Herschbein, IBM Systems & Technology; Dr. Chad Rue, FEI Company; Mr. John A. Giacobbe, Intel Corporation

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