10.6
Die Level Defect Analysis Using Combined Techniques of AFP with Electron Microscopes
Monday, November 4, 2013
The Tech Museum
Ms. Lan Yin Lee
,
Xilinx Asia Pacific Pte Ltd, Singapore, Singapore
Haonan Bai
,
Xilinx Asia Pacific Pte Ltd, Singapore, Singapore
Chua Kok Keng
,
Xilinx Asia Pacific Pte Ltd, Singapore, Singapore
Chow Yew Meng
,
Xilinx Asia Pacific Pte Ltd, Singapore, Singapore
Grace Tan
,
Xilinx Asia Pacific Pte Ltd, Singapore, Singapore
Mr. Daniel Nuez
,
Xilinx, San Jose, CA
Mr. Douglas Hamilton
,
Xilinx, San Jose, CA
