3
Session 3: Test and Diagnostics
Monday, November 4, 2013: 1:05 PM-2:45 PM
Meeting Room 230B (San Jose McEnery Convention Center)
Session Chairs:
Mr. Geir Eide
and
Mr. Mark E. Kimball
1:05 PM
Early Inline Detection of Systematic Defects Using ATPG & Commonality Analysis On Product-Like Logic Yield Learning Vehicle
Dr. Felix Beaudoin, IBM;
Dr. Zhigang Song, IBM;
Mr. Stephen Lucarini, IBM;
Mr. Thomas F. Mechler, IBM;
Mr. Stephen Wu, IBM;
Mr. Todd Cohen, IBM;
Dr. Mark Lagus, IBM;
Mr. Dieter Wendel, IBM;
Mr. Bruno Spruth, IBM;
Mr. Kevin Stanley, IBM;
Mr. David Bogdan, IBM
1:55 PM
Improving Failure Analysis for Cell-Internal Defects through Cell Aware Technology
F. Hapke, Mentor Graphics;
Dr. Martin Keim, Mentor Graphics;
T. Herrmann, GLOBALFOUNDRIES;
T. Heidel, GLOBALFOUNDRIES;
M. Reese, AMD, Inc.;
J. Schloeffel, Mentor Graphics;
J. Rivers, AMD, Inc.;
W. Redemund, Mentor Graphics;
A. Over, AMD, Inc.;
A. Glowatz, Mentor Graphics;
A. Fast, Mentor Graphics;
Brady Benware, Mentor Graphics;
J. Rajski, Mentor Graphics
