10.8
Validity-Study of Pind Test Put in the Screening Test for Cavity Devices for Space Application
Validity-Study of Pind Test Put in the Screening Test for Cavity Devices for Space Application
Monday, November 4, 2013
The Tech Museum
Summary:
Using the transistors of the TO-18 package, we verify the validity of PIND test for cavity devices, and we propose that PIND test should be necessarily carried out for the screening test for cavity devices for space application.
Using the transistors of the TO-18 package, we verify the validity of PIND test for cavity devices, and we propose that PIND test should be necessarily carried out for the screening test for cavity devices for space application.