39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013): Optimization of Soft Defect Localization Technique Scan Time Using Dummy Subroutine Test Vector Insertion

9.7
Optimization of Soft Defect Localization Technique Scan Time Using Dummy Subroutine Test Vector Insertion

Wednesday, November 6, 2013: 3:30 PM

Meeting Room 230B (San Jose McEnery Convention Center)

Mr. Boon Lian Yeoh , GLOBALFOUNDRIES, Singapore, Singapore

See more of: Session 9: Photon Based Techniques - 1
See more of: Symposium