9
Session 9: Photon Based Techniques - 1

Wednesday, November 6, 2013: 9:00 AM-5:10 PM
Meeting Room 230B (San Jose McEnery Convention Center)
Session Chairs:
Dr. Frank Zachariasse and Dr. Herve Deslandes
9:00 AM
9.1
Laser Voltage Imaging and Its Derivatives, Efficient Techniques to Address Defect On 28nm Technology
Mr. Thierry Parrassin, ST Microelectronics; Mr. Guillaume Celi, ST Microelectronics; Dr. Antoine Reverdy, Sector Technologies; Sylvain Dudit, ST Microelectronics; Michel Vallet, ST Microelectronics; Dr. Philippe Perdu, Centre National d'Etudes Spatiales (CNES); Prof. Dean Lewis, IMS laboratory, University of Bordeaux
9:25 AM
9.2
Advanced Fault Localization Through Use of Tester Based Diagnostics With Lvi, Lvp, CPA and PEM
Ms. Laura Safran, IBM; Mr. John Sylvestri, IBM; Mr. Dave Albert, IBM; Mr. Patrick McGinnis, IBM; Dr. Zhigang Song, IBM
9:50 AM
Break
10:05 AM
9.3
Scan Shift Debug Using LVI Phase Mapping
Mr. Yin (Roy) Ng, NVIDIA; Howard Lee Marks, NVIDIA; Chun-Cheng Tsao, DCG Systems; Jim Vickers, DCG Systems; Christopher Nemirow, DCG Systems
10:30 AM
9.4
C.W. Electro Optical Probing and Mapping As a Complementarities of Static and Dynamic Emmi
Mr. Kevin Sanchez, CNES - French Space Agency; Dr. Philippe Perdu, CNES - French Space Agency
10:55 AM
9.5
32nm CMOS SOI Test Site for Emission Tool Evaluation
Mr. Alan J. Weger, IBM T.J. Watson Research Center
11:20 AM
9.6
Tester-Based Methods to Enhance Spatial Resolvability and Interpretation of Time-Integrated and Time-Resolved Emission Measurements
Dr. Franco Stellari, IBM Research; Dr. Peilin Song, IBM T.J. Watson Research Center; Alan J. Weger, IBM T.J. Watson Research Center; Dzmitry Maliuk, IBM Research; Herschel Ainspan, IBM Research; Seongwon Kim, IBM Research; Christian Baks, IBM Research
11:45 AM
Lunch
1:30 PM
Poster Session and Dessert Reception
3:30 PM
9.7
Optimization of Soft Defect Localization Technique Scan Time Using Dummy Subroutine Test Vector Insertion
Mr. Boon Lian Yeoh, GLOBALFOUNDRIES
3:55 PM
9.8
Realizing Dynamic Thermal Laser Stimulation By Lock-in IR-Obirch Assisted With a Current Detection Probe Head
Mr. Chunlei Wu, Freescale Semiconductor (China) Limited; Prof. Suying yao, Tianjin University
4:20 PM
9.9
Electrical Modeling of the Effect of Photoelectric Laser Fault Injection On Bulk CMOS Design
Mr. Laurent Hériveaux, CEA-Leti, Minatec Campus; Dr. Jessy Clediere, CEA-Leti, Minatec Campus; Dr. Stéphanie Anceau, CEA-Leti, Minatec Campus
4:45 PM
9.10
Comparison of Beam-Based Failure Analysis Techniques for Microsystems-Enabled Photovoltaics
Dr. Benjamin B. Yang, Sandia National Laboratories; Dr. Jose Luis Cruz-Campa, Sandia National Laboratories; Dr. Gaddi S. Haase, Sandia National Laboratories; Dr. Edward I. Cole, Sandia National Laboratories; Dr. Paiboon Tangyunyong, Sandia National Laboratories; Dr. Murat Okandan, Sandia National Laboratories; Dr. Gregory N. Nielson, Sandia National Laboratories
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