10.13
Failure Localization of An Electrical Transient Behavior On a Mixed-Mode IC By Using Static Emission Microscopy Technique

Monday, November 4, 2013
The Tech Museum
Ms. Magdalena Anna Sienkiewicz , Freescale Semiconductor, Toulouse, France
Ms. Estelle Huynh , Freescale Semiconductor, Toulouse, France
Mr. Alain Vidal , Freescale Semiconductor, Toulouse, France
Mr. Philippe Rousseille , Freescale Semiconducteurs France SAS, Toulouse, Toulouse, France

See more of: Session 10: Posters
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