39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Transmission Electron Microscopy
Sunday, November 3, 2013: 2:15 PM
Meeting Room 230C (San Jose McEnery Convention Center)
Dr. Sam Subramanian
,
Freescale Semiconductor, Inc., Austin, TX
See more of:
Microscopy
See more of:
Tutorial