Microscopy

Sunday, November 3, 2013: 10:15 AM-4:15 PM

Meeting Room 230C (San Jose McEnery Convention Center)

Session Chairs:

Mr. Carl M. Nail and Mr. Bryan Tracy

10:15 AM

Scanning Electron Microscopy
Dr. William E. Vanderlinde, Laboratory for Physical Sciences

11:15 AM

The Role of the AFM Yield and FA
Mr. James (Jim) Colvin, FA Instruments

12:15 PM

Ultra-High Resolution in the SEM
Dr. William E. Vanderlinde, Laboratory for Physical Sciences

1:15 PM

Lunch

2:15 PM

Transmission Electron Microscopy
Dr. Sam Subramanian, Freescale Semiconductor, Inc.

3:15 PM

Materials Characterization for Failure Analysis
Dr. William E. Vanderlinde, Laboratory for Physical Sciences

4:15 PM

Break

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