Marginal RF Gain Investigation and Root Cause Determination

Harber, Keith

5.12
Marginal RF Gain Investigation and Root Cause Determination

Tuesday, November 5, 2013: 3:50 PM

Meeting Room 230A (San Jose McEnery Convention Center)

Mr. Keith Harber , TriQuint Semiconductor, Inc., Hillsboro, OR

Mr. Steve Brockett , TriQuint Semiconductor, Inc., Hillsboro, OR

Summary:

This paper outlines the failure analysis of an RF-only failure on a complex MMPA module, where slightly lower gain was observed in one mode of operation.

See more of: Session 5: Case Studies and the Failure Analysis Process
See more of: Symposium

5.12 Marginal RF Gain Investigation and Root Cause Determination

5.12
Marginal RF Gain Investigation and Root Cause Determination