FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA

Sunday, November 3, 2013: 5:30 PM

Meeting Room 230A (San Jose McEnery Convention Center)

Mr. Gregory M. Johnson , IBM, Hopewell Junction, NY

Mr. Christopher D'Aleo , IBM, Hopewell Junction, NY

Mr. Harvey E. Berman , IBM Systems & Technology, Hopewell Junction, NY

Mr. Satish Kodali , IBM, Hopewell Junction, NY

Mr. Balisingham Bahierathan , ST Microelectronics, Hopewell Junction, NY

See more of: Fault Localization
See more of: Tutorial