Fault Localization

Sunday, November 3, 2013: 1:15 PM-6:30 PM
Meeting Room 230A (San Jose McEnery Convention Center)
Session Chairs:
Ms. Susan Li and Dr. Mayue Xie
1:15 PM
Beam-Based Defect Localization
Dr. Edward I. Cole Jr., Sandia National Laboratories
2:15 PM
Laser Induced Techniques For Microelectronic Failure Analysis: SDL and Lada
Dr. Michael Bruce, Consultant
3:15 PM
Failure Localization With Active and Passive VC In FIB and SEM
Dr. Ruediger Rosenkranz, Fraunhofer Institute for Non-Destructive Testing
4:15 PM
Break
4:30 PM
Defect Localization By Lock-in-Thermography
Mr. Frank Altmann, Fraunhofer Institute for Mechanics of Materials
5:30 PM
FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA
Mr. Gregory M. Johnson, IBM; Mr. Christopher D'Aleo, IBM; Mr. Harvey E. Berman, IBM Systems & Technology; Mr. Satish Kodali, IBM; Mr. Balisingham Bahierathan, ST Microelectronics
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