9.10
Comparison of Beam-Based Failure Analysis Techniques for Microsystems-Enabled Photovoltaics

Wednesday, November 6, 2013: 4:45 PM
Meeting Room 230B (San Jose McEnery Convention Center)
Dr. Benjamin B. Yang , Sandia National Laboratories, Albuquerque, NM
Dr. Jose Luis Cruz-Campa , Sandia National Laboratories, Albuquerque, NM
Dr. Gaddi S. Haase , Sandia National Laboratories, Albuquerque, NM
Dr. Edward I. Cole , Sandia National Laboratories, Albuquerque, NM
Dr. Paiboon Tangyunyong , Sandia National Laboratories, Albuquerque, NM
Dr. Murat Okandan , Sandia National Laboratories, Albuquerque, NM
Dr. Gregory N. Nielson , Sandia National Laboratories, Albuquerque, NM

Summary:

Microsystems-enabled photovoltaics (MEPVs) is an approach that utilizes microfabrication techniques to create arrays of thin and efficient solar cells. The scaling effects enabled by this technique results in great potential to meet increasing demands for light-weight photovoltaic solutions with high power density. This paper covers failure analysis techniques used to support the development of MEPVs with a focus on the beam-based methods of LIVA, TIVA, OBIC, and SEI. Each FA technique is useful in different situations, and the examples in this paper show the relative advantages of each method for the failure analysis of MEPVs.
See more of: Session 9: Photon Based Techniques - 1
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