11.11
Dc/Dv and C-V Characterization of Gate Resistance Defects in Edram Circuits

Thursday, November 7, 2013: 3:00 PM
Meeting Room 230A (San Jose McEnery Convention Center)
Ms. Sweta Pendyala , IBM, Hopewell Junction, NY
David Albert , IBM, Hopewell Junction, NY
Michael Tenney , IBM, Hopewell Junction, NY
Katherine. V Hawkins , IBM, Hopewell Junction, NY

See more of: Session 11: Nanoprobing and Nanoscale Electrical Failure Analysis
See more of: Symposium