11.12
Applications of Nanoprobing for Localization of Design for Manufacturing Issues On Analogue-to-Digital Converter On Advanced Technology Node

Thursday, November 7, 2013: 3:25 PM
Meeting Room 230A (San Jose McEnery Convention Center)
Dr. Alfred C.T. Quah , GLOBALFOUNDRIES Singapore, Singapore, Singapore
Dr. Changqing Chen , GLOBALFOUNDRIES Singapore, Singapore, Singapore
Mr. Ghim Boon Ang , GLOBALFOUNDRIES Singapore, Singapore, Singapore
D NAGALINGAM , GLOBALFOUNDRIES Singapore, Singapore, Singapore
Mr. Yan Li , GLOBALFOUNDRIES Singapore, Singapore, Singapore
Dr. Jie Zhu , GLOBALFOUNDRIES Singapore, Singapore, Singapore
Soh Ping Neo , GLOBALFOUNDRIES Singapore, Singapore, Singapore
Dr. SiPing Zhao , GLOBALFOUNDRIES Singapore, Singapore, Singapore

Summary:

This work showcase precise device characterization with nanoprobing that enabled resolution of design weakness relating to analogue to digital converter on 40nm new products.
See more of: Session 11: Nanoprobing and Nanoscale Electrical Failure Analysis
See more of: Symposium