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Session 1: Emerging Concepts and Techniques

Monday, November 4, 2013: 10:00 AM-12:05 PM
Meeting Room 230AB (San Jose McEnery Convention Center)
Session Chairs:
Dr. Michael Bruce and Dr. Huimeng Wu
10:00 AM
Pump Probe Imaging of Integrated Circuits
Dr. David Stoker, SRI International
10:25 AM
A Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of Vlsi Circuits
Dr. Franco Stellari, IBM Research; Alan Weger, IBM Research; Seongwon Kim, IBM Research; Dzmitry Maliuk, IBM Research; Dr. Peilin Song, IBM T.J. Watson Research Center; Herschel Ainspan, IBM Research; Young Kwark, IBM Research; Christian Baks, IBM Research; Dr. Ulrike Kindereit, IBM T.J. Watson Research Center; Vikas Anant, Photon Spot; Mr. Ted R. Lundquist, DCG Systems, Inc
10:50 AM
3D Magnetic Field Imaging for Non-Destructive Fault Isolation
Dr. Antonio Orozco, Neocera; Mr. Jan Gaudestad, Neocera LLC; Mr. Nicolas Gagliolo, Neocera; Mr. Christopher Rowlett, Neocera; Mr. Enoch Wong, Neocera; Mr. Alex Jeffers, Center for Nanophysics and Advanced Materials; Mr. Ben Cheng, Center for Nanophysics and Advanced Materials; Dr. Frederick C. Wellstood, Center for Nanophysics and Advanced Materials; Dr. Fulvio Infante, Injtraspec Technologies; Dr. A. B. Cawthorne, Trevecca Nazarene University
11:15 AM
Time-Resolved Thermoreflectance Imaging for Thermal Testing and Analysis
Dr. Kazuaki Yazawa, Purdue University; Mr. Dustin Kendig, BS EE, Microsanj LLC; Prof. Ali Shakouri, Purdue University
11:40 AM
Two-Photon-Absorption-Enhanced Laser-Assisted Device Alteration and Single-Event Upsets in 28nm Silicon Integrated Circuits
Dr. Keith A. Serrels, DCG Systems; Mr. Kent Erington, Freescale Semiconductor; Mr. Dan J. Bodoh, Freescale Semiconductor; Prof. Derryck T. Reid, Heriot-Watt University; Dr. Carl Farrell, Heriot-Watt University; Mr. Neel Leslie, DCG Systems; Dr. Ted R. Lundquist, DCG Systems; Dr. Praveen Vedagarbha, DCG Systems
12:05 PM
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